X-Scan
Imaging Corporation headquartered in San Jose, California
is a leading domestic manufacturer of high-performance, CMOS Linear
Diode Arrays (LDA), CMOS & CCD Time Delayed Integration (TDI)
detectors and line-scan camera systems designed for both visible
and radiographic imaging applications.
TDI is an established and effective scanning technology capable
of increasing exposure times over conventional LDA systems without
compromising scanning speed and inspection time. TDI also offers
particular advantages when used in high-energy x-ray, gamma ray,
betatron and neutron imaging applications.
X-Scan’s unique device structure
and shielding design offers users reliable high-speed x-ray
imaging and extended operating lifetime in a broad range of
laboratory and on-line production and inspection environments,
including automated product quality inspection, non-destructive
testing (NDT), and computed tomography (CT). Other applications
include printed circuit board inspection, weld inspection, automotive
wheel and tire inspection, food/pharmaceutical inspection and
cargo screening.
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X-ray
Sensitive TDI (Time-Delay Integration) Camera Improves
Speed & Resolution for
Hi-Energy In-Line Radiographic Imaging |
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